FESEM   ㅣ   SEM5000Pro


CIQTEK SEM5000Pro is a field emission scanning electron microscope (FESEM) with high-resolution imaging and analysis ability, supported by abundant functions, benefits from advanced electron optics column design, with high-pressure electron beam tunnel technology (SuperTunnel), low aberration, and MFL objective lens, achieves low voltage high-resolution imaging, the magnetic specimen can also be analyzed.


With optical navigation, automated functionalities, carefully designed human-computer interaction user interface, and optimized operation and use process, no matter if you are an expert or not, you can quickly get started and complete high-resolution imaging and analysis work.


Technical Highlights


  • High-resolution imaging at low accelerating voltage.
  • Electromagnetic composite objective improves low-voltage resolution and enables magnetic specimen observation.
  • High-pressure tunneling technology (SuperTunnel) ensures low voltage resolution.
  • The electronic optical path without crossover effectively reduces system aberration and improves resolution.
  • Water-cooled constant temperature objective lens, to ensure the stability, reliability, and repeatability of the objective lens work.
  • Magnetic deflected six-hole various aperture system, with automatic switchable apertures, no mechanical adjustment needed, achieves high-resolution imaging or large beam analysis mode through a click-away fast switching.

SEM5000Pro Image Gallery

FESEM SEM5000Pro Specifications
Key Parameters
Resolution
0.8 nm @ 15 kV, SE
1.2 nm @ 1 kV, SE
Acceleration Voltage
0.02~30 kV
Magnification
1~2,500,000 x
Electron Gun Type
High Brightness Schottky Field Emission Electron Gun
Specimen Chamber
Vacuum System
Fully Automated Control
Cameras
Dual Cameras (optical navigation + chamber monitor)
Stage Range

X=110 mm, Y=110 mm, Z=50 mm

T: -10*~+70°, R: 360°

Detectors and Extensions
Standard

In-lens Detector

Everhart-Thornley Detector (ETD)

Optional

Retractable Backscattered Electron Detector (BSED)

Retractable Scanning Transmission Electron Microscope(STEM)

Energy Dispersive Spectroscopy (EDS, EDX)

Electron Backscatter Diffraction Pattern (EBSD)

Airlock

Trackball & Knob Control Panel

Software
Languages
English
Operating System
Windows
Navigation
Nav-Cam, Gesture Quick Navigation
Automatic Functions
Auto Brightness & Contrast, Auto Focus, Auto Stigmator