
FSEM ㅣ SEM4000Pro
Analytical field emission scanning electron microscope (FESEM) equipped with a high-brightness long-life Schottky field emission electron gun
With the three-stage condenser electron optics column design for beam currents up to 200 nA, SEM4000Pro delivers advantages in EDS, EBSD, WDS, and other analytical applications. The system supports low vacuum mode as well as a high-performance low-vacuum secondary electron detector and retractable backscattered electron detector, which can help directly observe poorly conductive or even non-conductive samples.
Standard optical navigation mode and an intuitive user operation interface make your analysis work easy.