Tungsten Filament SEM ㅣ SEM3200
High-performance tungsten filament SEM microscope with excellent imaging quality capabilities in both high and low vacuum modes
The CIQTEK SEM3200 SEM Microscope has a large depth of field with a user-friendly interface to enable users to characterize specimens and explore the world of microscopic imaging and analysis.
Technical Highlights
Low Voltage SEM
Carbon material specimens with shallow penetration depth at the low voltage. The true topography of the specimen surface can be obtained with rich details.
Low Voltage-Carbon
High Voltage-Carbon
The electron beam irradiation damage of the hair specimen is reduced at low voltage while the charge effect is eliminated.
Low Vacuum SEM
Filtered fiber tube materials are poorly conductive and charge significantly in high vacuum. Direct observation of non-conductive specimens can be done in a low vacuum without coating by SEM Microscope SEM3200.
Low Vacuum
High Vacuum
Quick Gesture Navigation
CIQTEK SEM Microscope SEM3200 Quick navigation is achieved by double-clicking to move, using the middle mouse button to drag, and using the frame to zoom.
Exp: Frame Zoom - to get a large view of the specimen with low magnification navigation, you can quickly frame the specimen area you are interested in, image zooms in automatically to improve efficiency.
Large Field of View
Biological specimens, using a large field of view observation, can easily obtain the overall morphology details of a ladybug's head, demonstrating cross-scale imaging ability.
Stage Anti-collision
CIQTEK SEM Microscope SEM3200 Multi-way Anti-collision Solutions:
1. Manually input specimen height: precisely control the distance between the specimen surface and the objective lens.
2. Image recognition and motion capture: monitor the real-time stage movement.
3. *Hardware: shut down the stage motor at the moment of collision.
Characteristic Functions
Intelligence Assisted Image Astigmatism Correction
Visually display astigmatism within the entire field of view, and quickly adjust to correct by mouse clicking.
SEM3200 Image Gallery
Cathode-Carbon 5 kV / ETD
Anode-Lithium Cobaltate 15 kV / ETD
Solar Battery-1 5 kV / ETD
Solar Battery-2 10 kV / ETD
Polymer Foam 15 kV / ETD
MOF-Material 15 kV / ETD
Stainless Steel-Brass Weldments 15 kV / BSED
Alloy Fracture Brittleness+Toughness 20 kV / ETD
Iron and Steel Inclusions 15 kV / BSED
Iron and Steel Inclusions 15 kV / ETD
Diatom 10 kV / ETD
Accessories
SEM Detectors for SEM3200
The SEM Microscope is used not only to observe surface morphology but also to analyze the composition of micro-regions on the specimen surface.
CIQTEK SEM Microscope SEM3200 has a large specimen chamber with an extensive interface. In addition to supporting conventional Everhart–Thornley detector (ETD), Backscattered-Electron detector (BSE), and Energy-dispersive X-ray spectroscopy (EDS/EDX), various interfaces such as Electron Backscatter Diffraction Pattern (EBSD) and Cathodoluminescence (CL) are also reserved.
>> SEM Backscattered-Electron Detector (BSE)
Comparison of secondary electron imaging and backscattered electron imaging
In the backscattered electron imaging mode, the charge effect is significantly suppressed and more information on the composition of the specimen surface can be observed.
Plating Specimens:
Tungsten Steel Alloy Specimens:
Four-quadrants Backscattered Electron Detector - Multi-channel Imaging
The SEM Microscope detector has a compact design and high sensitivity. With the 4-quadrants design, it is possible to obtain topographic images in different directions as well as composition distribution images without tilting the specimen.
Four 1-channel Images
Component Images
Energy Spectrum
LED small bead energy spectrum analysis results.
>> SEM Electron Backscatter Diffraction Pattern (EBSD)
The SEM Microscope SEM3200 with a large beam current fully meets the testing requirements of high-resolution EBSD and can analyze polycrystalline materials such as metals, ceramics, and minerals for crystal orientation and grain size analysis.
The figure shows the EBSD grain map of Ni metal specimen, which can identify grain size and orientation, determine grain boundaries and twins, and make accurate assessments of material organization and structure.
FESEM SEM3200 Specifications | SEM3200A | SEM3200 | ||
| Electro-Optical Systems | Electron Gun | Pre-aligned Medium-sized Hairpin-type Tungsten Filament | ||
| Resolution | High Vaccum | 3 nm @ 30 kV (SE) | ||
| 4 nm @ 30 kV (BSE) | ||||
| 8 nm @ 3 kV (SE) | ||||
| Low Vacuum | 3 nm @ 30 kV (SE) | |||
| Magnification | 1-300,000x (Film) | |||
| 1-1000,000x | ||||
| Acceleration Voltage | 0.2 kV ~ 30 kV | |||
| Probe Current | ≥1.2μA, Real-time display | |||
| Imaging Systems | SEM Detectors | Everhart-Thornley Detector (ETD) | ||
| *Backscattered electron detector (BSED), *Low vacuum secondary electron detector(SE), *Energy dispersive spectroscopy (EDS/EDX), etc. | ||||
| Image Format | TIFF, JPG, BMP, PNG | |||
| Specimen Chamber | Camera | Optical Navigation nguages | ||
| Monitoring in the Specimen Chamber | ||||
| Specimen Table | Three Axis Automatic | Five Axis Automatic | ||
| Stage Range | X: 120 mm | X: 120 mm | ||
| Y: 115 mm | Y: 115 mm | |||
| Z: 50 mm | Z: 50 mm | |||
| / | R: 360° | |||
| / | T: -10° ~ +90° | |||
| Software | Operating System | Windows | ||
| Navigations | Optical Navigation, Gesture Quick Navigation | |||
| Automatic Functions | Auto Brightness & Contrast, Auto Focus, Automatic Stigmator | |||
| Special Functions | Intelligence Assisted Image Astigmatism Correction *Large-FOV Image Stitching (Optional) | |||
| Installation Requirements | Temperature | 20°C (68°F) ~ 25°C (77°F) | ||
| Humidity | ≤ 50 % | |||
| Power Supply | AC 220 V (±10 %), 50 Hz, 2 kVA AC 110V (±10%), 60Hz | |||
