
FIB-SEM ㅣ DB500
Field Emission Scanning Electron Microscope (FE-SEM) with Focused Ion Beam (FIB) Columns
The CIQTEK DB500 Focused Ion Beam Scanning Electron Microscope (FIB-SEM) adopts “SuperTunnel” electron optics technology, low aberration, and non-magnetic objective design with low voltage and high-resolution capability to ensure the nano-scale analysis. The ion column facilitates a Ga+ liquid metal ion source with a highly stable and high-quality ion beam for nanofabrication.
FIB-SEM DB500 has an integrated nano-manipulator, gas injection system, electrical anti-contamination mechanism for the objective lens, and 24 expansion ports, making it an all-around nano-analysis and fabrication platform with comprehensive configurations and expandability.